CHAMORRO-PINCHAO , Anderson; PUSDÁ-CHULDE , Marco; TREJO-ESPAÑA , Diego; CARANQUI-SÁNCHEZ , Victor; GARCÍA-SANTILLÁN , Iván. Binary classification of defects in multiple coffee beans using lightweight convolutional neural networks for embedded systems. Data and Metadata, [S. l.], v. 4, p. 840, 2025. DOI: 10.56294/dm2025840. Disponível em: https://dm.ageditor.ar/index.php/dm/article/view/840. Acesso em: 30 dec. 2025.